Title :
Generation of deterministic test patterns by minimal basic test sets
Author :
Kunzmann, Arno B.
Author_Institution :
Forschungszentrum Inf., Karlsruhe, Germany
Abstract :
The author presents a new strategy to select a minimal test pattern set as a basis for test pattern generation by specific software or hardware modules. In contrast to other proposals this procedure is totally independent of the used test pattern generation algorithm. Based on the basic deterministic test pattern set, the test generation hardware can be easily realized. It is possible to show that the storage requirements could be drastically reduced on an average of more than 80% compared with the original deterministic test pattern sets
Keywords :
logic testing; deterministic test patterns generation; minimal basic test sets; minimal test pattern; storage requirements; Automatic testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Compaction; Fault detection; Hardware; Minimization methods; Test pattern generators;
Conference_Titel :
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Conference_Location :
Hamburg
Print_ISBN :
0-8186-2780-8
DOI :
10.1109/EURDAC.1992.246226
