DocumentCode :
3374814
Title :
Benchmark face detection using a face recognition database
Author :
Hsu, Gee-Sern ; Tran, Thu Ha ; Chung, Sheng-Lun
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
3821
Lastpage :
3824
Abstract :
A framework is proposed to generate datasets good for benchmarking face detection using database meant for benchmarking face recognition. Instead of the common way of collecting images manually, the datasets from the proposed framework are made by a synthesis process with two phases: intrinsic parameterization and extrinsic parameterization. The former parameterizes the intrinsic variables that affect the appearance of a face, while the latter parameterizes the extrinsic variables that dominate how faces appear on background images as required by a test criterion. Experiments reveal that the proposed framework can generate test samples similar to those available from a popular face detection database, and also samples unavailable from existing face databases.
Keywords :
face recognition; benchmark face detection; extrinsic parameterization; face recognition database; intrinsic parameterization; Benchmark testing; Databases; Face; Face detection; Face recognition; Lighting; Phase frequency detector; Face detection; face recognition; facial database;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5654037
Filename :
5654037
Link To Document :
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