DocumentCode
3374814
Title
Benchmark face detection using a face recognition database
Author
Hsu, Gee-Sern ; Tran, Thu Ha ; Chung, Sheng-Lun
Author_Institution
Dept. of Mech. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
3821
Lastpage
3824
Abstract
A framework is proposed to generate datasets good for benchmarking face detection using database meant for benchmarking face recognition. Instead of the common way of collecting images manually, the datasets from the proposed framework are made by a synthesis process with two phases: intrinsic parameterization and extrinsic parameterization. The former parameterizes the intrinsic variables that affect the appearance of a face, while the latter parameterizes the extrinsic variables that dominate how faces appear on background images as required by a test criterion. Experiments reveal that the proposed framework can generate test samples similar to those available from a popular face detection database, and also samples unavailable from existing face databases.
Keywords
face recognition; benchmark face detection; extrinsic parameterization; face recognition database; intrinsic parameterization; Benchmark testing; Databases; Face; Face detection; Face recognition; Lighting; Phase frequency detector; Face detection; face recognition; facial database;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5654037
Filename
5654037
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