• DocumentCode
    3374828
  • Title

    Design for Bit Error Rate estimation of high speed serial links

  • Author

    Guin, Ujjwal ; Chiang, Chen-Huan

  • Author_Institution
    Dept. of ECE, Temple Univ., Philadelphia, PA, USA
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    278
  • Lastpage
    283
  • Abstract
    High speed serial links, consisting of SerDes devices, require the Bit Error Rate (BER) to be at the level of 10-12 or lower. The excessive test time for comparing each captured bit for error detection in the traditional BER measurement and the costly instrumentation are major drawbacks for high volume production test of SerDes devices. In this paper, we propose a design for BER estimation methodology which includes a new BER estimation method, a simple BER test system which incorporates a novel design of time-to-digital converter (TDC).
  • Keywords
    error statistics; BER test system; SerDes devices; bit error rate estimation; error detection; high speed serial links; time-to-digital converter; Bit error rate; Clocks; Delay; Erbium; Estimation; Jitter; Mathematical model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783734
  • Filename
    5783734