DocumentCode
3374828
Title
Design for Bit Error Rate estimation of high speed serial links
Author
Guin, Ujjwal ; Chiang, Chen-Huan
Author_Institution
Dept. of ECE, Temple Univ., Philadelphia, PA, USA
fYear
2011
fDate
1-5 May 2011
Firstpage
278
Lastpage
283
Abstract
High speed serial links, consisting of SerDes devices, require the Bit Error Rate (BER) to be at the level of 10-12 or lower. The excessive test time for comparing each captured bit for error detection in the traditional BER measurement and the costly instrumentation are major drawbacks for high volume production test of SerDes devices. In this paper, we propose a design for BER estimation methodology which includes a new BER estimation method, a simple BER test system which incorporates a novel design of time-to-digital converter (TDC).
Keywords
error statistics; BER test system; SerDes devices; bit error rate estimation; error detection; high speed serial links; time-to-digital converter; Bit error rate; Clocks; Delay; Erbium; Estimation; Jitter; Mathematical model;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
978-1-61284-657-6
Type
conf
DOI
10.1109/VTS.2011.5783734
Filename
5783734
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