Title :
Built-in-self-test for the Tandem NonStop CLX processor
Author :
Garcia, David J.
Author_Institution :
Tandem Comput. Inc., Cupertino, CA, USA
fDate :
Feb. 29 1988-March 3 1988
Abstract :
A built-in-self-test (BIST) method is presented that uses pseudorandom test vectors and scan path design. The BIST method used on the NonStop CLX processor is shown as an example. The pseudorandom test covers several custom CMOS ICs, commercial MSI logic, a static RAM array, and their interconnects. The BIST also does a functional test of the dynamic RAM main memory and its control logic. The BIST is low-cost and requires minimal overhead to support the test function. Control of the test is handled by maintenance processor software, simplifying the hardware dedicated to BIST.<>
Keywords :
automatic testing; computer testing; fault tolerant computing; integrated circuit testing; logic testing; minicomputers; BIST method; Tandem NonStop CLX processor; built-in-self-test; commercial MSI logic; control logic; custom CMOS ICs; dynamic RAM main memory; functional test; maintenance processor software; minimal overhead; pseudorandom test vectors; scan path design; static RAM array; Built-in self-test; CMOS logic circuits; DRAM chips; Hardware; Logic arrays; Logic testing; Random access memory; Read-write memory; Software maintenance; Software testing;
Conference_Titel :
Compcon Spring '88. Thirty-Third IEEE Computer Society International Conference, Digest of Papers
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-8186-0828-5
DOI :
10.1109/CMPCON.1988.4922
