DocumentCode
3374974
Title
Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -
Author
Okawara, Hideo
Author_Institution
Verigy Japan, K.K., Tokyo, Japan
fYear
2011
fDate
1-5 May 2011
Firstpage
322
Lastpage
322
Abstract
This is an embedded tutorial. It consists of two sections. The first section reviews several basic background topics for understanding the practical application examples presented in the second section. Most mixed signal tests employ the FFT-based processing. Firstly the relationship of the sampled waveform and the frequency spectrum is discussed by reviewing the DFT and IDFT equations. In the second section, there are three practical application examples presented. The first example is the trend removal. The second example reduces noise on small signals measured by a passive resistive probe in the TDR experiments. The third example demonstrates the planning procedure of wideband signal under-sampling.
Keywords
discrete Fourier transforms; inverse transforms; mixed analogue-digital integrated circuits; signal denoising; signal sampling; AC-coupled measurement; DC offset drift; DFT equation; FFT-based signal processing; IDFT equation; IFFT method; TDR experiments; frequency spectrum; mixed signal test; noise reduction; passive resistive probe; sampled waveform; signal denoising; trend removal; wideband signal capturing; wideband signal under-sampling; Baseband; Equations; Frequency domain analysis; Guidelines; Noise; Noise measurement; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
978-1-61284-657-6
Type
conf
DOI
10.1109/VTS.2011.5783741
Filename
5783741
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