• DocumentCode
    3374974
  • Title

    Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -

  • Author

    Okawara, Hideo

  • Author_Institution
    Verigy Japan, K.K., Tokyo, Japan
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    322
  • Lastpage
    322
  • Abstract
    This is an embedded tutorial. It consists of two sections. The first section reviews several basic background topics for understanding the practical application examples presented in the second section. Most mixed signal tests employ the FFT-based processing. Firstly the relationship of the sampled waveform and the frequency spectrum is discussed by reviewing the DFT and IDFT equations. In the second section, there are three practical application examples presented. The first example is the trend removal. The second example reduces noise on small signals measured by a passive resistive probe in the TDR experiments. The third example demonstrates the planning procedure of wideband signal under-sampling.
  • Keywords
    discrete Fourier transforms; inverse transforms; mixed analogue-digital integrated circuits; signal denoising; signal sampling; AC-coupled measurement; DC offset drift; DFT equation; FFT-based signal processing; IDFT equation; IFFT method; TDR experiments; frequency spectrum; mixed signal test; noise reduction; passive resistive probe; sampled waveform; signal denoising; trend removal; wideband signal capturing; wideband signal under-sampling; Baseband; Equations; Frequency domain analysis; Guidelines; Noise; Noise measurement; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783741
  • Filename
    5783741