Title :
Special session: Hot topic: Smart silicon
Author :
Winemberg, LeRoy ; Tehranipoor, Mohammad
Abstract :
The goal of this hot topic session is to discuss this cutting-edge topic that is being researched by several teams in both academia and industry, and debate which is the best approach for sub-65nm silicon designs. The point of debate will be what embedded circuits make the most sense (aging, enablement of more aggressive design, characterization, diagnosis, debug, etc.).
Keywords :
ageing; elemental semiconductors; integrated circuit design; silicon; Si; academia; aggressive design; aging; characterization; cutting-edge topic; debug; diagnosis; embedded circuits; industry; smart silicon; sub-65nm silicon designs; Aging; Artificial intelligence; Economics; Indium tin oxide; Lead; Monitoring; Stacking;
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
Print_ISBN :
978-1-61284-657-6
DOI :
10.1109/VTS.2011.5783742
