DocumentCode
3375182
Title
Theoretical modeling of superscalar processor performance
Author
Noonburg, Derek B. ; Shen, John P.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
1994
fDate
30 Nov.-2 Dec. 1994
Firstpage
52
Lastpage
62
Abstract
The current trace-driven simulation approach to determine superscalar processor performance is widely used but has some shortcomings. Modern benchmarks generate extremely long traces, resulting in problems with data storage, as well as very long simulation run times. More fundamentally, simulation generally does not provide significant insight into the factors that determine performance or a characterization of their interactions. This paper proposes a theoretical model of superscalar processor performance that addresses these shortcomings. Performance is viewed as an interaction of program parallelism and machine parallelism. Both program and machine parallelisms are decomposed into multiple component functions. Methods for measuring or computing these functions are described. The functions are combined to provide a model of the interaction between program and machine parallelisms and an accurate estimate of the performance. The computed performance, based on this model, is compared to simulated performance for six benchmarks from the SPEC 92 suite on several configurations of the IBM RS/6000 instruction set architecture.
Keywords
discrete event simulation; parallel processing; performance evaluation; IBM RS/6000 instruction set architecture; SPEC 92 suite; benchmarks; data storage; machine parallelism; program parallelism; simulation run times; superscalar processor performance; trace-driven simulation; Computational modeling; Computer aided instruction; Computer architecture; Computer simulation; Hardware; Memory; Parallel processing; Permission; Process design; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microarchitecture, 1994. MICRO-27. Proceedings of the 27th Annual International Symposium on
ISSN
1072-4451
Print_ISBN
0-89791-707-3
Type
conf
DOI
10.1109/MICRO.1994.717410
Filename
717410
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