Title :
Local binary pattern probability model based facial feature localization
Author :
Tao, Xiong ; Lei, Xu ; Kongqiao, Wang ; Jiangwei, Li ; Yong, Ma
Author_Institution :
Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
In this paper, an active shape model (ASM) based facial feature localization strategy is proposed, which employs a local binary pattern (LBP) probability model. Due to the computation simplicity and illumination insensitivity of LBP texture descriptor and the learning ability of the probability model, the algorithm is robust and fast. In addition, component-based ASM is used to impose reasonable constraints on the shape. Multi-state shape and texture models with state classifier are trained to handle highly flexible components, i.e. eyes and mouth. Our database consisting of tens of persons with various expressions and illuminations is used to train and verify the proposed algorithm. The experiments demonstrate its accuracy, efficiency and robustness.
Keywords :
face recognition; image texture; probability; shape recognition; LBP probability model; LBP texture descriptor; active shape model; component-based ASM; facial feature localization; local binary pattern probability model; multistate shape; Active shape model; Computational modeling; Face; Mouth; Pixel; Robustness; Shape; Active shape model; facial feature localization; local binary pattern; probability model;
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2010.5654056