DocumentCode
3375211
Title
Levelized low cost delay test compaction considering IR-drop induced power supply noise
Author
Jiang, Zhongwei ; Wang, Zheng ; Wang, Jing ; Walker, D.M.H.
Author_Institution
Dept. of Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
fYear
2011
fDate
1-5 May 2011
Firstpage
52
Lastpage
57
Abstract
Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated over prior work.
Keywords
delays; integrated circuit noise; integrated circuit testing; power supply circuits; IR drop induced power supply noise; delay testing; estimation metrics; guardbands circuit delay; levelized low cost delay test compaction; Compaction; Computational modeling; Correlation; Delay; Integrated circuit modeling; Noise; Power supplies; IR drop; delay test; dynamic compaction; power supply noise; static compaction;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
978-1-61284-657-6
Type
conf
DOI
10.1109/VTS.2011.5783754
Filename
5783754
Link To Document