Title :
Levelized low cost delay test compaction considering IR-drop induced power supply noise
Author :
Jiang, Zhongwei ; Wang, Zheng ; Wang, Jing ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
Power supply noise is very important in delay testing. Excessive noise can cause circuit delay increases that lead to test overkill. Test patterns that are too quiet can lead to test escapes. In this work, we introduce a realistic low cost delay test compaction flow that guardbands circuit delay during test using a sequence of estimation metrics. Significant reductions in CPU time are demonstrated over prior work.
Keywords :
delays; integrated circuit noise; integrated circuit testing; power supply circuits; IR drop induced power supply noise; delay testing; estimation metrics; guardbands circuit delay; levelized low cost delay test compaction; Compaction; Computational modeling; Correlation; Delay; Integrated circuit modeling; Noise; Power supplies; IR drop; delay test; dynamic compaction; power supply noise; static compaction;
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
Print_ISBN :
978-1-61284-657-6
DOI :
10.1109/VTS.2011.5783754
