DocumentCode :
3375290
Title :
Advanced methods for leveraging new test standards
Author :
Laisne, Mike
Author_Institution :
Qualcomm, USA
fYear :
2011
fDate :
1-5 May 2011
Firstpage :
97
Lastpage :
97
Abstract :
This session explores how newly introduced standards are supporting innovative industry practices. First, a new update for 1149.1, including new instructions, extensions, and a new procedural language, is reviewed. Next, techniques for implementing concurrent test using P1687 are described. Finally, a method is examined, using P1581, for connectivity testing of ICs with no boundary scan.
Keywords :
IEEE standards; integrated circuit testing; IC; IEEE 1149.1; IEEE P1581; IEEE P1687; concurrent testing; connectivity testing; procedural language; test standard;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
978-1-61284-657-6
Type :
conf
DOI :
10.1109/VTS.2011.5783758
Filename :
5783758
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3375290
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