• DocumentCode
    3375290
  • Title

    Advanced methods for leveraging new test standards

  • Author

    Laisne, Mike

  • Author_Institution
    Qualcomm, USA
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    97
  • Lastpage
    97
  • Abstract
    This session explores how newly introduced standards are supporting innovative industry practices. First, a new update for 1149.1, including new instructions, extensions, and a new procedural language, is reviewed. Next, techniques for implementing concurrent test using P1687 are described. Finally, a method is examined, using P1581, for connectivity testing of ICs with no boundary scan.
  • Keywords
    IEEE standards; integrated circuit testing; IC; IEEE 1149.1; IEEE P1581; IEEE P1687; concurrent testing; connectivity testing; procedural language; test standard;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783758
  • Filename
    5783758
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3375290