Title :
EMC coupling to a circuit board from a wire penetrating a cavity aperture
Author :
Lertsirimit, C. ; Jackson, D.R. ; Wilton, D.R. ; Erricolo, D. ; Yang, D.H.Y.
Author_Institution :
Dept. of Electr. & Comput. Eng., Houston Univ., TX, USA
Abstract :
The analysis of printed circuit boards (PCBs) is a problem of recent interest. Of particular interest is the electromagnetic coupling from an exterior field to a circuit component on a PCB inside a conducting cavity (shield) via a direct connection from a wire or cable that penetrates an aperture in the cavity; indeed, this may often be the dominant coupling mechanism. An accurate and efficient analysis of this EMC problem requires the combination of PCB analysis with the analysis of field penetration into a cavity via a penetrating wire, and this is the subject of the present investigation. A hybrid technique for calculating the signal level at the input to a device on a PCB due to an exterior field incident on the cavity is discussed. The technique separates the analysis of the cavity/wire from that of the conductor trace on the PCB, thus enabling an efficient calculation. The method allows a The´venin equivalent circuit to be obtained at any point on the PCB, such as a point where the PCB conductor trace meets a circuit component of interest on the PCB.
Keywords :
computational electromagnetics; electromagnetic compatibility; electromagnetic coupling; electromagnetic field theory; electromagnetic shielding; equivalent circuits; network analysis; printed circuits; EM coupling; PCB analysis; Thevenin equivalent circuit; cavity aperture; circuit board; circuit component; conducting cavity; conductor trace; electromagnetic coupling; printed circuit board analysis; shielding; Apertures; Cable shielding; Circuit analysis; Conductors; Coupling circuits; Electromagnetic compatibility; Electromagnetic coupling; Equivalent circuits; Printed circuits; Wire;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
DOI :
10.1109/APS.2004.1329652