• DocumentCode
    3375440
  • Title

    Chip Size Estimation for SOC Design Space Exploration

  • Author

    Jeschke, Hartwig

  • Author_Institution
    Inst. fur Mikroelektronische Systeme, Hannover Univ.
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    56
  • Lastpage
    62
  • Abstract
    At early design space exploration phases of architectures for systems on a chip (SOC) total costs of silicon are of high interest. An accurate chip size estimation needs detailed knowledge of the transistor densities of a semiconductor process. This paper introduces a novel and simplified chip size estimator, which is independent of manufacturer specific process data. CMOS processes are characterized by only three parameters. These are the drawn gate length and the used numbers of metal layers for logic and for memories. A minimum possible chip size (bestcase) is evaluated from the numbers of transistors for logic and for memories, and from the number of pad cells. The chip size estimator has been derived from a comprehensive analysis of realized VLSI chips. It has been investigated and confirmed either for published VLSIs as well as for latest SOC designs with 221 million transistors and 333 million transistors. The proposed model contributes to analytical modeling of cost and performance tradeoffs of SOC concepts
  • Keywords
    CMOS integrated circuits; integrated circuit design; logic design; system-on-chip; CMOS process; SOC; VLSI chip; chip size estimation; design space exploration; semiconductor process; system-on-chip; transistor density; Analytical models; CMOS logic circuits; Costs; Manufacturing processes; Pulp manufacturing; Semiconductor process modeling; Silicon; Space exploration; System-on-a-chip; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded Computer Systems: Architectures, Modeling and Simulation, 2006. IC-SAMOS 2006. International Conference on
  • Conference_Location
    Samos
  • Print_ISBN
    1-4244-0155-0
  • Type

    conf

  • DOI
    10.1109/ICSAMOS.2006.300809
  • Filename
    4084750