Title :
Design verification considering manufacturing tolerances by using worst-case distances
Author :
Graeb, Helmut E. ; Wieser, Claudia U. ; Antreich, Kurt J.
Author_Institution :
Inst. of Electron. Design Autom., Tech. Univ. of Munich, Germany
Abstract :
A new method for design verification on circuit level considering the inevitable manufacturing tolerances is presented. It is based on a specific backward evaluation of performance specifications, which can be done efficiently with a sequential quadratic programming method using standard simulation tools. The specific backward evaluation yields exact worst-case parameter sets and corresponding worst-case distances for all specifications separately. Automatic circuit quality analysis enables a detailed design verification and supports the circuit design process by planning aids for a design step. The various features of the method are illustrated using a small tutorial circuit example. A practical example of an integrated CMOS analog circuit proves the efficiency of the new approach
Keywords :
CMOS integrated circuits; circuit analysis computing; formal verification; quadratic programming; automatic circuit quality analysis; circuit level; design verification; integrated CMOS analog circuit; manufacturing tolerances; performance specifications; sequential quadratic programming; specific backward evaluation; standard simulation tools; tutorial circuit example; worst-case distances; worst-case parameter sets; Circuit analysis; Circuit simulation; Circuit synthesis; Computer aided manufacturing; Design automation; Design methodology; Design optimization; Performance analysis; Pulp manufacturing; Robustness;
Conference_Titel :
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Conference_Location :
Hamburg
Print_ISBN :
0-8186-2780-8
DOI :
10.1109/EURDAC.1992.246260