DocumentCode :
3375497
Title :
Simulated superior performances of semiconductor superjunction devices
Author :
Fujihira, Tatsuhiko ; Miyasaka, Yasushi
Author_Institution :
Fuji Electr. Co. Ltd., Matsumoto, Japan
fYear :
1998
fDate :
3-6 Jun 1998
Firstpage :
423
Lastpage :
426
Abstract :
The performances of majority- and minority-carrier semiconductor superjunction devices are examined and compared to that of standard devices in terms of forward current density, reverse leakage current, and switching charge. Based on two-dimensional simulations and theoretical calculations, it is shown that two orders of magnitude improvement in forward current density, an order of magnitude improvement in switching charge for majority-carrier superjunction devices, and an order of magnitude improvement in forward current density for minority-carrier superjunction devices are feasible when compared to standard devices
Keywords :
Schottky diodes; current density; leakage currents; minority carriers; p-n junctions; power MOSFET; power semiconductor diodes; power semiconductor switches; semiconductor device models; switching; 2D simulations; MOSFET; Schottky-barrier diode; forward current density; majority-carrier semiconductor superjunction devices; majority-carrier superjunction devices; minority-carrier semiconductor superjunction devices; minority-carrier superjunction devices; p-n junction diode; performance simulation; reverse leakage current; semiconductor superjunction devices; switching charge; Conducting materials; Current density; FETs; Leakage current; MOSFET circuits; P-n junctions; Power semiconductor switches; Production facilities; Semiconductor devices; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
Conference_Location :
Kyoto
ISSN :
1063-6854
Print_ISBN :
0-7803-4752-8
Type :
conf
DOI :
10.1109/ISPSD.1998.702736
Filename :
702736
Link To Document :
بازگشت