Title :
Optimized numerical mapping scheme for filter-based exon location in DNA using a quasi-Newton algorithm
Author :
Ramachandran, Parameswaran ; Lu, Wu-Sheng ; Antoniou, Andreas
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Victoria, Victoria, BC, Canada
fDate :
May 30 2010-June 2 2010
Abstract :
An optimized numerical mapping scheme for achieving improved location of exons in DNA sequences using digital filters is proposed. Characteristic numerical values for the four nucleotides, referred to as pseudo-EIIP values, are obtained using a training procedure where the location accuracy is maximized using a quasi-Newton algorithm based on the Broyden-Fletcher-Goldfarb-Shanno updating formula. A training set of 80 DNA sequences is chosen from the HMR195 database. The objective function for the optimization procedure is formulated using the so-called receiver operating characteristic (ROC) technique and the procedure is initialized using electron-ion interaction potential (EIIP) values. Unbiased testing of the optimized characteristic values is carried out using a set of DNA sequences that has no overlap with the training set. Simulation results show that the pseudo-EIIP values yield more accurate exon locations than those obtained using the actual EIIP values.
Keywords :
DNA; Newton method; band-pass filters; biomedical communication; genomics; notch filters; optimisation; Broyden-Fletcher-Goldfarb-Shanno updating formula; DNA sequences; HMR195 database; bandpass notch digital filters; called receiver operating characteristic technique; electron-ion interaction potential; filter-based exon location; location accuracy; optimized numerical mapping scheme; pseudo-EIIP values; quasi-Newton algorithm; Charge carrier processes; Computational efficiency; DNA; Databases; Digital filters; Frequency; Organisms; Proteins; Sequences; Testing; BFGS updating formula; DNA; ROC plots; bandpass notch digital filters; electron-ion interaction potential; exons; period-3 property;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537209