• DocumentCode
    3375570
  • Title

    Multi-layer Level Measurement Using Adaptive Filtering

  • Author

    De Oliveira, José Igor S ; Catunda, Sebastian Yuri C ; Barros, Allan Kardec ; Naviner, Jean-François

  • Author_Institution
    Univ. Fed. do Maranhao, Sao Luis
  • Volume
    1
  • fYear
    2005
  • fDate
    16-19 May 2005
  • Firstpage
    732
  • Lastpage
    736
  • Abstract
    In several applications the measurement of the levels of multi-layer liquids cannot be carried out using sensors in direct contact with the substances. In these cases, one alternative is to use contactless ultrasonic transducers and measure the time-of-flight of the echoes produced by the reflection of a known signal by the different layers. We propose a measurement system for using with ultrasonic transducers that is composed by an adaptive filter for noise cancellation and cross-correlation measurement to identify the time instants of the received echoes. Simulations results are presented for the measurement of the level of two-layer liquids and show the efficiency of the proposed structure
  • Keywords
    acoustic wave reflection; adaptive filters; echo; level measurement; multilayers; ultrasonic transducers; adaptive filtering; contactless ultrasonic transducers; cross-correlation measurement; digital signal processing; echo detection; echoes; measurement system; multi-layer level measurement; multi-layer liquids; noise cancellation; signal reflection; time-of-flight; two-layer liquids; ultrasonic signals; Adaptive filters; Displacement measurement; Level measurement; Liquids; Noise measurement; Pulse measurements; Sensor phenomena and characterization; Time measurement; Ultrasonic transducers; Ultrasonic variables measurement; Adaptive Filtering; Digital Signal Processing; Echo Detection; Level Measurement; Time-of- Flight Measurement; Ultrasonic Signals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    0-7803-8879-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2005.1604214
  • Filename
    1604214