DocumentCode :
3375609
Title :
Hierarchical generation of pin accurate SystemC models based on RF circuit schematics
Author :
Wang, Yifan ; Chen, Zhimiao ; Heinen, Stefan
Author_Institution :
Integrated Analog Circuits & RF Syst., RWTH Aachen, Aachen, Germany
fYear :
2010
fDate :
23-24 Sept. 2010
Firstpage :
25
Lastpage :
30
Abstract :
This paper presents a method to generate pin accurate SystemC models based on the RF circuit schematics, using a SKILL based routine. This method addresses the verification and modeling of the analog/RF circuits in the event driven digital domain using SystemC, based on the same data base created by the circuit designer. The proposed method was employed to model a specific test case, comprising a phase locked loop in a RF receiver chain. The reliability of the SystemC models have been proven by comparing the simulation results with the Verilog-AMS(wreal) models. The pin accurate SystemC models were found to be well suited for top down design, virtual prototyping and verification in SoC implementation. Additionally, the SystemC models are very efficient regarding the simulation speed and flexibility to pass abstract data types with real numbers through the ports.
Keywords :
C++ language; analogue circuits; circuit reliability; electronic engineering computing; hardware description languages; network synthesis; phase locked loops; radio receivers; system-on-chip; virtual prototyping; RF circuit schematic; RF receiver chain; SKILL based routine; SoC implementation; Verilog-AMS model; analog-RF circuit modelling; circuit designer; event driven digital domain; phase locked loop; pin accurate SystemC model; reliability; specific test case modelling; top down design; virtual prototyping; Hardware design languages; Integrated circuit modeling; Object oriented modeling; Phase locked loops; Radio frequency; Solid modeling; Voltage-controlled oscillators; RF; SystemC; modeling; verification; virtual prototyping SoC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Behavioral Modeling and Simulation Conference (BMAS), 2010 IEEE International
Conference_Location :
San Jose, CA
ISSN :
2160-3804
Print_ISBN :
978-1-4244-8996-1
Type :
conf
DOI :
10.1109/BMAS.2010.6156593
Filename :
6156593
Link To Document :
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