DocumentCode :
3375775
Title :
Electro-Mechanical Measurement of Nano Wires -Evaluation of Lambda DNA Wire Coated with Palladium Nano Particles
Author :
Hosogi, M. ; Hashiguchi, G. ; Ayano, K. ; Takahashi, H. ; Haga, M. ; Yonezawa, T. ; Fujita, H.
Author_Institution :
Kagawa Univ., Kagawa
fYear :
2007
fDate :
10-14 June 2007
Firstpage :
1071
Lastpage :
1074
Abstract :
We have measured conductivity of palladium coated DNA nano wires using micromachined tweezers. In the experiment, we configured an atomic force microscope (AFM) to the electrical measurement of bridged nano wires between the tweezers probes and utilized a special AFM cantilever having a knife-wedge shape tip with a very low spring constant for applying a loading force to the wire. Using the apparatus, an electric current through the wire was monitored applying 0.5 DC voltage while in a loading and unloading process. The resistance of the wire was changed apparently by the deformation; we estimated the gauge factor 4.87. As demonstrated here, this method is useful for an electro-mechanical evaluation technique of nano materials.
Keywords :
DNA; atomic force microscopy; electrical conductivity; electromechanical effects; micromachining; nanoparticles; nanowires; palladium; AFM cantilever; Pd; atomic force microscope; bridged nanowires; conductivity measurement; lambda DNA wire; micromachined tweezers; nanoparticles; nanowire electro-mechanical measurement; voltage 0.5 V; Atomic force microscopy; Atomic measurements; Conductivity measurement; DNA; Electric variables measurement; Force measurement; Palladium; Particle measurements; Shape measurement; Wires; AFM; DNA Tweezers; DNA-Pd Wire; Pd nano particle; piezo-resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
Type :
conf
DOI :
10.1109/SENSOR.2007.4300319
Filename :
4300319
Link To Document :
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