DocumentCode
3375901
Title
A generic software system for drift reliability optimization of VLSI circuits
Author
Huang, Min ; Styblinski, M.A.
Author_Institution
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fYear
1992
fDate
7-10 Sep 1992
Firstpage
578
Lastpage
583
Abstract
A generic software system called GOSSIPDR (generic optimization system for statistical improvement of performance) to perform DR (drift reliability) analysis and optimization is presented. This system was developed based on new DR analysis and optimization methodologies. Several useful system features and functions are described. Applications in VLSI circuit design are given, in which degradations due to hot electron effects are considered
Keywords
VLSI; circuit CAD; monolithic integrated circuits; reliability; GOSSIPDR; VLSI circuits; drift reliability optimization; generic software system; hot electron effects; Application software; Circuit synthesis; Degradation; Electrons; Integrated circuit reliability; Optimization methods; Packaging; Performance analysis; Software systems; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1992., EURO-VHDL '92, EURO-DAC '92. European
Conference_Location
Hamburg
Print_ISBN
0-8186-2780-8
Type
conf
DOI
10.1109/EURDAC.1992.246325
Filename
246325
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