Title :
An analytical method for determining the characteristics of two-layered media
Author :
Mertzanides, Ioannis C. ; Tsokas, Gregory N. ; Sahalos, John N.
Author_Institution :
Dept. of Geol., Aristotle Univ. of Thessaloniki, Greece
Abstract :
Summary form only given. Reflectometry offers a simple tool for determining the dielectric properties of materials. For homogeneous materials the procedure is simple and only a single measurement of the reflection coefficient is enough. If the material is inhomogeneous or stratified, indirect procedures for calculating the dielectric properties are required. A direct method for determining the dielectric properties and the thickness of a lossy two-layered stratified dielectric structure is presented. The technique is based on the study of the frequency response of the complex reflection coefficient of a plane wave incident at the interface between the stratified media and the air. The frequency span must contain at least two adjacent extreme values of the input impedance. Examples for different models of the method and its error analysis are presented
Keywords :
dielectric properties; electric impedance; electromagnetic wave reflection; error analysis; frequency response; inhomogeneous media; reflectometry; complex reflection coefficient; dielectric properties; direct method; error analysis; frequency response; inhomogeneous material; input impedance; lossy two-layered stratified dielectric structure; plane wave; reflection coefficient measurement; reflectometry; stratified material; thickness; two-layered media; Dielectric losses; Dielectric materials; Frequency; Geology; Laboratories; Physics; Reflection; Reflectometry; Surface impedance; Water pollution;
Conference_Titel :
Applied Electromagnetism, 2000. Proceedings of the Second International Symposium of Trans Black Sea Region on
Conference_Location :
Xanthi
Print_ISBN :
0-7803-6428-7
DOI :
10.1109/AEM.2000.943275
