DocumentCode
3376019
Title
Robust local ternary patterns for texture categorization
Author
Xian-Hua Han ; Gang Xu ; Yen-Wei Chen
Author_Institution
Coll. of Inf. Sci. & Eng., Ritsumeikan Univ., Kusatsu, Japan
fYear
2013
fDate
16-18 Dec. 2013
Firstpage
846
Lastpage
850
Abstract
This paper proposes a new image representation for texture categorization, which is based on extension of local binary patterns (LBP). As we know LBP can achieve effective description ability with appearance invariance and adaptability of patch matching based methods. However, LBP only thresholds the differential values between neighborhood pixels and the focused one to 0 or 1, which is very sensitive to noise existing in the processed image. This study extends LBP to local ternary patterns (LTP), which considers the differential values between neighborhood pixels and the focused one as negative or positive stimulus if the absolute differential value is large; otherwise no stimulus (set as 0). With the ternary values of all neighbored pixels, we can achieve a pattern index for each local patch, and then extract the pattern histogram for image representation. Experiments on two texture datasets: Brodats32 and KTH TIPS2-a validate that the robust LTP can achieve much better performances than the conventional LBP and the state-of-the-art methods.
Keywords
feature extraction; image matching; image representation; image texture; Brodats32 dataset; KTH TIPS2 dataset; LBP; LTP; appearance invariance; description ability; image representation; local binary patterns; local patch; neighborhood pixels; patch matching based methods; pattern histogram extraction; pattern index; robust local ternary pattern; texture categorization; Educational institutions; Histograms; Image representation; Materials; Noise; Robustness; Support vector machines; Texture recognition; local binary patterns; local ternary patterns; micro-structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Engineering and Informatics (BMEI), 2013 6th International Conference on
Conference_Location
Hangzhou
Print_ISBN
978-1-4799-2760-9
Type
conf
DOI
10.1109/BMEI.2013.6747059
Filename
6747059
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