• DocumentCode
    3376105
  • Title

    Transceiver parameter detection using a high conversion gain RF amplitude detector

  • Author

    Sleiman, Sleiman Bou ; Ismail, Mohammed

  • Author_Institution
    ECE Dept., Ohio State Univ., Columbus, OH, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    2059
  • Lastpage
    2062
  • Abstract
    In this work, we present a wideband CMOS RF amplitude detector for on-chip self-test and calibration. The high conversion gain detector enables accurate on-chip amplitude measurements and allows for accurate transceiver parameter prediction. The detector operates from 500MHz to 9GHz while detecting signal amplitudes from 0 to 0.7V with a sensitivity of -10V/V. Several test cases are presented to demonstrate the functionality of the design and its ability to detect key RF block parameters such as gain, distortion, and phase mismatch. The detector is built in 0.18μm CMOS and consumes less than 0.8mW from a 1.8V power supply.
  • Keywords
    CMOS integrated circuits; integrated circuit testing; system-on-chip; transceivers; calibration; frequency 500 MHz to 9 GHz; high conversion gain RF amplitude detector; key RF block parameters; on-chip amplitude measurements; on-chip self-test; size 0.18 mum; transceiver parameter detection; wideband CMOS RF amplitude detector; Built-in self-test; Calibration; Detectors; Gain measurement; Phase detection; RF signals; Radio frequency; Signal detection; Transceivers; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537235
  • Filename
    5537235