DocumentCode :
3376105
Title :
Transceiver parameter detection using a high conversion gain RF amplitude detector
Author :
Sleiman, Sleiman Bou ; Ismail, Mohammed
Author_Institution :
ECE Dept., Ohio State Univ., Columbus, OH, USA
fYear :
2010
fDate :
May 30 2010-June 2 2010
Firstpage :
2059
Lastpage :
2062
Abstract :
In this work, we present a wideband CMOS RF amplitude detector for on-chip self-test and calibration. The high conversion gain detector enables accurate on-chip amplitude measurements and allows for accurate transceiver parameter prediction. The detector operates from 500MHz to 9GHz while detecting signal amplitudes from 0 to 0.7V with a sensitivity of -10V/V. Several test cases are presented to demonstrate the functionality of the design and its ability to detect key RF block parameters such as gain, distortion, and phase mismatch. The detector is built in 0.18μm CMOS and consumes less than 0.8mW from a 1.8V power supply.
Keywords :
CMOS integrated circuits; integrated circuit testing; system-on-chip; transceivers; calibration; frequency 500 MHz to 9 GHz; high conversion gain RF amplitude detector; key RF block parameters; on-chip amplitude measurements; on-chip self-test; size 0.18 mum; transceiver parameter detection; wideband CMOS RF amplitude detector; Built-in self-test; Calibration; Detectors; Gain measurement; Phase detection; RF signals; Radio frequency; Signal detection; Transceivers; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
Type :
conf
DOI :
10.1109/ISCAS.2010.5537235
Filename :
5537235
Link To Document :
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