Title :
Dispersion characteristics of multilayer coplanar waveguide using Single Layer Reduction (SLR) technique
Author :
Singh, Paramjeet ; Verma, A.K.
Author_Institution :
Dept. of Electron. Sci., Univ. of Delhi South Campus, New Delhi, India
Abstract :
In this paper the Single Layer Reduction (SLR) technique is presented to compute dispersion characteristics of multilayer coplanar waveguide (CPW) with finite conductor thickness. The effective relative permittivity for the multilayer structure is derived from conformal mapping. Then SLR technique is used to convert multilayer CPW structure to an equivalent single layer structure. The dispersion characteristic of equivalent CPW structure is calculated from the closed form expressions.
Keywords :
conformal mapping; coplanar waveguides; conformal mapping; dispersion characteristics; finite conductor thickness; multilayer coplanar waveguide; single layer reduction technique; Coplanar waveguides; Nonhomogeneous media; Coplanar Waveguide (CPW); Dispersion; Single Layer Reduction (SLR);
Conference_Titel :
Students' Technology Symposium (TechSym), 2011 IEEE
Conference_Location :
Kharagpur
Print_ISBN :
978-1-4244-8941-1
DOI :
10.1109/TECHSYM.2011.5783804
