DocumentCode
3376224
Title
In-place decomposition for robustness in FPGA
Author
Lee, Ju-Yueh ; Feng, Zhe ; He, Lei
Author_Institution
Electr. Eng. Dept., Univ. of California, Los Angeles, CA, USA
fYear
2010
fDate
7-11 Nov. 2010
Firstpage
143
Lastpage
148
Abstract
The programmable logic block (PLB) in a modern FPGA features a built-in carry chain (or adder) and a decomposable LUT, where such an LUT may be decomposed into two or more smaller LUTs. Leveraging decomposable LUTs and underutilized carry chains, we propose to decompose a logic function in a PLB into two subfunctions and to combine the subfunctions via a carry chain to make the circuit more robust against single-event upsets(SEUs). Note that such decomposition can be implemented using the decomposable LUT and carry chain in the original PLB without changing the PLB-level placement and routing. Therefore, it is an in-place decomposition (IPD) with no area and timing overhead at the PLB level and has an ideal design closure between logic and physical syntheses. For 10 largest combinational MCNC benchmark circuits with a conservative 20% utilization rate for carry chain, IPD improves MTTF (mean time to failure) by 1.43 and 2.70 times respectively, for PLBs similar to those in Xilinx Virtex-5 and Altera Stratix-IV.
Keywords
adders; field programmable gate arrays; programmable logic devices; FPGA; adder; built-in carry chain; combinational MCNC benchmark circuits; decomposable LUT; in-place decomposition; logic function; mean time to failure; programmable logic block; single-event upsets; Circuit faults; Field programmable gate arrays; Logic functions; Observability; Random access memory; Robustness; Table lookup;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-8193-4
Type
conf
DOI
10.1109/ICCAD.2010.5654113
Filename
5654113
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