• DocumentCode
    3376308
  • Title

    Impact of Si DRIE on Vibratory MEMS Gyroscope Performance

  • Author

    Merz, P. ; Pilz, W. ; Senger, F. ; Reimer, K. ; Grouchko, M. ; Pandhumsoporn, T. ; Bosch, W. ; Cofer, A. ; Lassig, S.

  • Author_Institution
    Fraunhofer-Inst. fur Siliziumtechnologie, Itzehoe
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    1187
  • Lastpage
    1190
  • Abstract
    Today angular rate sensors (gyroscopes) for automotive application are fabricated by a silicon surface micromachining process (SMM). One critical performance parameter of these micromachined vibratory gyroscopes is the mechanical coupling between the drive and sense mode due to manufacturing imperfections. Excessive coupling, called quadrature error, leads to large zero rate output (ZRO or Q-Bias). This paper discusses for the first time, the dependence between quadrature error and profile asymmetries in relevant spring structures with respect to non-uniformities of the silicon deep reactive ion etch (Si DRiE) systems used for the SMM processing.
  • Keywords
    angular measurement; gyroscopes; micromachining; micromechanical devices; microsensors; sputter etching; DRiE; MEMS gyroscope; angular rate sensors; automotive; deep reactive ion etch systems; micromachined vibratory gyroscopes; quadrature error; surface micromachining process; zero rate output; Automotive applications; Capacitive sensors; Etching; Gyroscopes; Manufacturing; Mechanical sensors; Micromachining; Micromechanical devices; Silicon; Springs; Gyroscope; Si DRIE; profile asymmetry; quadrature error; surface micromachining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300348
  • Filename
    4300348