Title :
National ecological observatory network (NEON) airborne remote measurements of vegetation canopy biochemistry and structure
Author :
Johnson, Brian R. ; Kuester, Michele A. ; Kampe, Thomas U. ; Keller, Michael
Author_Institution :
NEON, Inc., Boulder, CO, USA
Abstract :
The National Ecological Observatory Network (NEON) is a continental-scale research platform for discovering, understanding and forecasting the impacts of climate change, land-use change, and invasive species on ecology. Site-based flux tower and field measurements will be coordinated with high resolution, regional airborne remote sensing observations. This data combined with satellite observations, national data sets and ecosystem models will extend site-based and regional coverage to the continental scale. The NEON Airborne Observation Platform (AOP) will carry remote sensing instrumentation designed to achieve sub-meter to meter scale ground resolution to bridge scales from organism and stand scales to the scale of satellite based remote sensing. The capability of the airborne system will be well beyond existing systems in its ability to produce quantitative information about ecosystem structure and functioning covering nearly 2 million hectares each year for 30 years or more.
Keywords :
biochemistry; climatology; ecology; geophysical image processing; land use planning; remote sensing; vegetation; weather forecasting; NEON airborne observation platform; airborne remote measurement; climate change; climate forecasting; continental scale; ecology; ecosystem model; ecosystem structure; field measurement; invasive species; land-use change; national ecological observatory network; regional airborne remote sensing observation; regional coverage; satellite based remote sensing; satellite observation; site-based flux tower; vegetation canopy biochemistry; Ecosystems; Imaging; Laser radar; Observatories; Remote sensing; Spectroscopy; Vegetation mapping; ecology; remote sensing; spectroscopy;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2010.5654121