DocumentCode :
3376539
Title :
Optical properties of thin GeSe2-CdI2(Sb2Se3)-CdSe films
Author :
Boycheva, S. ; Petkov, P. ; Vassilev, V.
Author_Institution :
Dept. of Semicond., Univ. Chem.Techn. & Metall, Sofia, Bulgaria
fYear :
2000
fDate :
2000
Firstpage :
148
Abstract :
Summary form only given. Some optical properties of thin films in the complicated chalcogenide GeSe2-CdI2(Sb2 Se3)-CdSe systems are studied as a function of the Cd and Sb content, respectively. The optical spectra of these thin films with different thickness were investigated using a spectrophotometer for the visible and IR regions. The spectra were analysed using special computer software "Layers". The investigations of the spectra of the films are carried out in the range 400-3000 nm. The general optical constants have been determined - the real and imaginary part of the dielectric function, the refractive index and the extinction. The spectral contribution of the absorption coefficient α is determined after fitting of the experimental data of R and T with simulated spectra using Lorentz-theory and Brend equations. The optical band-gap is determined by means of Tauc\´s procedure. There is evidence of structural changes in the films due to the increase of the valence density of the current carriers. The thin film structures were studied with a transmission electron microscope TEM Philips 3003. The electron microscope investigation provides information about the morphology of the films. The film composition has been investigated by Auger electron spectroscopy. The thin films, prepared under the above conditions are amorphous and without three-dimensional defects
Keywords :
Auger electron spectra; II-VI semiconductors; absorption coefficients; antimony compounds; cadmium compounds; chalcogenide glasses; dielectric function; germanium compounds; infrared spectra; optical films; photonic band gap; refractive index; semiconductor thin films; spectroscopy computing; thin films; transmission electron microscopy; visible spectra; Auger electron spectroscopy; Brend equations; GeSe2-CdI2-CdSe; GeSe2-CdI2-CdSe films; GeSe2-Sb2Se3-CdSe; GeSe2-Sb2Se3-CdSe films; IR region; Lorentz-theory equations; TEM Philips 3003; Tauc´s procedure; absorption coefficient; amorphous films; chalcogenide systems; current carriers; dielectric function; electron microscope; extinction; film composition; imaginary part; morphology; optical band-gap; optical constants; optical properties; optical spectra; real part; refractive index; special computer software layers; spectral contribution; spectrophotometer; structural changes; thickness; thin film structures; thin films; transmission electron microscope; valence density; visible region; Absorption; Dielectrics; Equations; Optical films; Optical refraction; Optical variables control; Refractive index; Software; Transistors; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Electromagnetism, 2000. Proceedings of the Second International Symposium of Trans Black Sea Region on
Conference_Location :
Xanthi
Print_ISBN :
0-7803-6428-7
Type :
conf
DOI :
10.1109/AEM.2000.943302
Filename :
943302
Link To Document :
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