• DocumentCode
    3376905
  • Title

    On power and fault-tolerance optimization in FPGA physical synthesis

  • Author

    Jose, Manu ; Hu, Yu ; Majumdar, Rupak

  • Author_Institution
    Comput. Sci. Dept., Univ. of California, Los Angeles, CA, USA
  • fYear
    2010
  • fDate
    7-11 Nov. 2010
  • Firstpage
    224
  • Lastpage
    229
  • Abstract
    Power and fault tolerance are deemed to be two orthogonal optimization objectives in FPGA synthesis, with independent attempts to develop algorithms and CAD tools to optimize each objective. In this paper, we study the relationship between these two optimizations and show empirically that there are strong ties between them. Specifically, we analyze the power and reliability optimization problems in FPGA physical synthesis (i.e., packing, placement, and routing), and show that the intrinsic structures of these two problems are very similar. Supported by the post routing results with detailed power and reliability analysis for a wide selection of benchmark circuits, we show that with minimal changes - fewer than one hundred lines of C code - an existing power-aware physical synthesis tool can be used to minimize the fault rate of a circuit under SEU faults. As a by-product of this study, we also show that one can improve the mean-time-to-failure by 100% with negligible area and delay overhead by performing fault-tolerant physical synthesis for FPGAs. The results from this study show a great potential to develop CAD systems co-optimized for power and fault-tolerance.
  • Keywords
    circuit CAD; circuit optimisation; circuit reliability; fault tolerant computing; field programmable gate arrays; low-power electronics; power aware computing; reliability theory; C code; CAD tool; FPGA physical synthesis; SEU fault; benchmark circuit; fault tolerance optimization; mean time to failure; power aware physical synthesis tool; power optimization; reliability analysis; single event upset; Circuit faults; Fault tolerance; Fault tolerant systems; Optimization; Routing; Sensitivity; Table lookup; FPGA; Fault Tolerance; Low Power; Physical Synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-8193-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.2010.5654149
  • Filename
    5654149