DocumentCode :
3376943
Title :
Empirical mode decomposition based probabilistic neural network for faults classification
Author :
Manjula, M. ; Mishra, Sukumar ; Sarma, AVRS
Author_Institution :
Dept. of Electr. Eng., Osmania Univ., Hyderabad, India
fYear :
2011
fDate :
22-24 Dec. 2011
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents a novel method of detecting and classifying the power system faults of voltage sags based on Empirical Mode Decomposition (EMD). A technique employed for analyzing power system fault data in terms of voltage sags is required. Also, provides information about the underlying event i.e. the fault type. EMD is to method which decomposes a non stationary signal into mono component and symmetric component signals called Intrinsic Mode Functions (IMFs). Further the Hilbert Transform (HT) of IMF provides magnitude and phase angle information. The characteristic features of the first three IMFs of each phase are used as inputs to the classifier Probabilistic Neural Network (PNN) for identification of fault type. Four types of shunt faults are taken for classification. A comparison is also made with wavelet Transform (WT). Simulation results show that the classification accuracy is better for EMD, which proves that the method is efficient in classifying the faults.
Keywords :
Hilbert transforms; fault diagnosis; neural nets; power engineering computing; power system faults; power system identification; probability; wavelet transforms; EMD; HT; Hilbert Transform; IMF; PNN; WT; empirical mode decomposition; intrinsic mode function; magnitude angle information; monocomponent signal; phase angle information; power system fault classification; power system fault detection; probabilistic neural network; shunt fault classification; symmetric component signal; voltage sag; wavelet transform; Circuit faults; Feature extraction; Power quality; Probabilistic logic; Transforms; Voltage fluctuations; Empirical mode decomposition; faults; hilbert transform; intrinsic mode functions; power quality; probabilistic neural network; voltage sag causes; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Systems (ICPS), 2011 International Conference on
Conference_Location :
Chennai
Print_ISBN :
INAVLID ISBN
Type :
conf
DOI :
10.1109/ICPES.2011.6156670
Filename :
6156670
Link To Document :
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