DocumentCode
3376946
Title
Finite element simulation of bulk- and surface acoustic wave (SAW) interaction in SAW devices
Author
Hofer, M. ; Finger, N. ; Kovacs, Gabor ; Schöber, J. ; Langer, U. ; Lerch, R.
Author_Institution
Dept. of Sensor Technol., Erlangen-Nurnberg Univ., Erlangen, Germany
Volume
1
fYear
2002
fDate
8-11 Oct. 2002
Firstpage
53
Abstract
Though loss parameters in SAW propagation are used as input for fast analysis models for the simulation of SAW devices, the quantitatively correct description of loss mechanisms is still a challenging task. Therefore, it is important to develop exact measurement and simulation methods which are able to determine these loss parameters accurately. By the use of special boundary conditions, the finite element method (FEM) is able to fulfill these requirements. Regarding the periodic substructure of common SAW devices, we have incorporated periodic boundary conditions (PBCs) in our simulation code. The piezoelectric substrate of SAW devices operating at high frequencies can be modeled as a semi-infinite half space. Therefore, we introduce newly evolved absorbing boundary conditions. They allow us to examine effects emerging from bulk acoustic wave (BAW) radiation (e.g. bulk wave onset frequencies) and assess propagation loss due to leakage and bulk wave conversion accurately.
Keywords
acoustic wave absorption; digital simulation; finite element analysis; surface acoustic wave devices; surface acoustic waves; BAW-SAW interaction; SAW devices; absorbing boundary conditions; bulk acoustic wave; bulk wave conversion; finite element method; finite element simulation; loss parameters; periodic boundary conditions; periodic substructure; piezoelectric substrate; simulation code; surface acoustic wave; Acoustic measurements; Acoustic propagation; Acoustic waves; Analytical models; Boundary conditions; Finite element methods; Loss measurement; Propagation losses; Surface acoustic wave devices; Surface acoustic waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN
1051-0117
Print_ISBN
0-7803-7582-3
Type
conf
DOI
10.1109/ULTSYM.2002.1193351
Filename
1193351
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