DocumentCode
3377230
Title
Analysis of log periodic dipole array antennas for site validation and radiated emissions testing
Author
Chen, Zhong ; Foegelle, Michael ; Harrington, Tim
Author_Institution
EMC Test Syst., Austin, TX, USA
Volume
2
fYear
1999
fDate
1999
Firstpage
618
Abstract
Log periodic dipole array (LPDA) antennas are one of the most widely used antenna types for normalized site attenuation (NSA) and radiated emission (RE) testing. A thorough understanding of the possible error sources associated with the calibration and application of LPDAs for EMC tests over a ground plane is essential for evaluating and minimizing measurement uncertainties. Systematic errors are present in the standard site calibration and NSA measurement, which are independent of random effects and equipment uncertainties. In an effort to determine the effects on NSA and RE testing, these errors are examined using a numerical moment-method model and measurements. Error contributions from mutual coupling between antenna and image, active phase center variation, radiation pattern, and cross-polarization effect are investigated
Keywords
antenna radiation patterns; calibration; dipole antenna arrays; electromagnetic compatibility; electromagnetic wave polarisation; log periodic antennas; measurement errors; measurement uncertainty; method of moments; test equipment; EMC tests; NSA measurement; active phase center variation; calibration; cross-polarization effect; error contributions; error sources; ground plane; log periodic dipole array antennas; measurement uncertainties; mutual coupling; normalized site attenuation; numerical moment-method model; radiated emissions testing; radiation pattern; site validation; standard site calibration; systematic errors; Antenna measurements; Attenuation; Calibration; Dipole antennas; Electromagnetic compatibility; Log periodic antennas; Measurement standards; Measurement uncertainty; Numerical models; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-5057-X
Type
conf
DOI
10.1109/ISEMC.1999.810088
Filename
810088
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