• DocumentCode
    3377272
  • Title

    Effects of on-package decoupling capacitors on the simultaneous switching noise

  • Author

    Chou, Tai-Yu

  • Author_Institution
    LSI Logic Corp., Fremont, CA, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    Effects of on-package decoupling capacitors on the simultaneous switching noise (SSN) of output drivers are presented. The effectiveness of the capacitor is a function of inductance from switching drivers to capacitors, and the signal/VSS/VDD stack-up of the package. For a μ-strip structure, the decoupling capacitor provides an AC shunt path between VSS and VDD that minimizes the impedance for signal transmission that leads to the reduction of SSN. The reduction of SSN is dependent on the inductance from chip pad to decoupling capacitor. Increasing this inductance will render the capacitor ineffective. For a tri-layer stripline structure, the decoupling capacitor has little effect on SSN reduction. SSN simulation results are compared and are consistent with the measurement data of an SSN dynamic electric test chip
  • Keywords
    capacitors; driver circuits; integrated circuit noise; integrated circuit packaging; AC shunt; chip pad; dynamic electric test; impedance; inductance; microstrip; on-package decoupling capacitors; output drivers; signal transmission; signal/VSS/VDD stack-up; simulation; simultaneous switching noise; tri-layer stripline; Capacitors; Impedance; Inductance; Integrated circuit noise; Logic; Packaging; Power supplies; Power transmission lines; Semiconductor device measurement; Variable structure systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 1995
  • Conference_Location
    Portland, OR
  • Print_ISBN
    0-7803-3034-X
  • Type

    conf

  • DOI
    10.1109/EPEP.1995.524694
  • Filename
    524694