DocumentCode
3377281
Title
Lightning radiated electric fields and their contribution to induced voltages
Author
Sorwar, M.G. ; Gosling, I.G.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Volume
2
fYear
1999
fDate
1999
Firstpage
635
Abstract
During the return stroke, the radiated electric field from a lightning channel contains vertical and horizontal components of the electric fields, which are both responsible for producing transients in power lines, telecommunication lines, and electronic circuitry of communication and control systems. This paper analyses the characteristics of the vertical and horizontal components of the electric field depending on different parametric conditions of the return stroke. Lightning induced voltages on an overhead telecommunication line are also calculated for different elemental fields. The numerical results show that horizontal electric field (HEF) produces high ringing of fields at distances far from the strike point, and plays an important role in producing induced voltages in the vicinity of the lightning channel. The radiation and the induction components of fields are found to be responsible for the change in polarity of induced voltages
Keywords
electric fields; electric potential; electromagnetic induction; electromagnetic interference; lightning; power overhead lines; telecommunication transmission lines; transients; communication systems; control systems; electronic circuitry; elemental fields; horizontal electric field; induced voltages; induction component; lightning channel; lightning induced voltages; lightning radiated electric fields; overhead telecommunication line; parametric conditions; power lines; radiated electric field; return stroke; telecommunication lines; transients; vertical electric field; Circuits; Clouds; Communication system control; Fault location; Lighting control; Lightning; Maxwell equations; Optical coupling; Surges; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-5057-X
Type
conf
DOI
10.1109/ISEMC.1999.810091
Filename
810091
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