DocumentCode
3377500
Title
Refinement of irradiance models in PV simulators can improve accuracy of system-level yield predictions
Author
Bourne, Ben ; Kimber, Adrianne ; Judkins, Zachary
Author_Institution
SunPower Corporation, 1414 Harbour Way South, Richmond, CA 94804, USA
fYear
2008
fDate
11-16 May 2008
Firstpage
1
Lastpage
3
Abstract
As the market emphasis on grid-tied PV systems shifts from peak power rating to total energy production, the accuracy of system-level production simulators becomes increasingly important. SunPower Corporation uses a proprietary in-house software package (PVGrid) that allows a high level of flexibility for modeling the mechanisms specific to our line of PV mounting products, including flat, fixed-tilt roof- and ground-mounts, and single NS-axis trackers. We have data available from a large fleet of installed fixed-tilt and tracking systems for validating the PVGrid models, and capitalized on this data to make improvements to the irradiance models in PVGrid. PVGrid previously used the DISC beam irradiance model, which may become unstable under certain climatic conditions and under-predict beam irradiance. We replaced this model with an updated version of the Perez beam model that includes a Linke turbidity term and an irradiance variability index. The refinement of our POA irradiance models and algorithms in PVGrid resulted in a reduction in MBE from - 36.7 to −2.31 and in RMSE from 87.18 to 74.07 for calculated POA irradiance using measured beam, diffuse, and POA irradiance data furnished by the Sandia National Labs. This reduction in MBE improved the total annual calculated POA from 94.6% to 99.6% of measured POA irradiance. The irradiance model refinements improved calculated POA irradiance accuracy for both high-beam climates (e.g., Southwest US) as well as for lower-beam climates (e.g., Northeast US, Germany).
Keywords
Predictive models;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location
San Diego, CA, USA
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2008.4922524
Filename
4922524
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