• DocumentCode
    3377659
  • Title

    Double-threshold reversible data hiding

  • Author

    Xuan, Guorong ; Shi, Yun Q. ; Teng, Jianzhong ; Tong, Xuefeng ; Chai, Peiqi

  • Author_Institution
    Dept. of Comput. Sci., Tongji Univ., Shanghai, China
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    1129
  • Lastpage
    1132
  • Abstract
    This proposed scheme reversibly embeds data into image prediction-errors by using histogram-pair method with double thresholds (embedding threshold and fluctuation threshold). The embedding threshold is used to select only those prediction-errors, whose magnitude does not exceed this threshold, for possible reversible data hiding. The fluctuation threshold is used to select only those prediction-errors, whose associated neighbor fluctuation does not exceed this threshold, for possible reversible data hiding. Only when both thresholds are satisfied the reversible data hiding is carried out. Image gray level histogram modification is conducted to shrink the image histogram towards the center to avoid underflow and/or overflow only when this is necessary. The required bookkeeping data are embedded together with pure payload for original image recovery late. The experimental results have demonstrated that the proposed scheme outperforms recently published reversible image data hiding schemes in terms of the highest PSNR of marked image vs. original image at given pure payloads.
  • Keywords
    data encapsulation; image processing; double-threshold reversible data hiding; histogram-pair method; image gray level histogram modification; image prediction-errors; image recovery; Authentication; Computer science; Data encapsulation; Data mining; Discrete wavelet transforms; Fluctuations; Histograms; PSNR; Payloads; Pixel; gray level histogram modification; histogram pair scheme; neighborhood fluctuation; prediction error; reversible image data hiding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537323
  • Filename
    5537323