DocumentCode
3377801
Title
Dependence CdS/CdTe solar cells efficiency and nonuniformity on CdS layer thickness
Author
Plotnikov, V.V. ; Davies, A.R. ; Sites, J.R. ; Compaan, A.D.
Author_Institution
Department of Physics and Astronomy, University of Toledo, OH 43606 USA
fYear
2008
fDate
11-16 May 2008
Firstpage
1
Lastpage
2
Abstract
We have prepared cell with a variable thickness of CdS layer to get an understanding of the optimum thickness as well as it lowest limits for practical purposes. We used quantum efficiency current-voltage and light beam induce current testing to investigate cell performance as well as nonuniformity. The best results are achieved with 0.1 micron CdS layer. This number does depend slightly on the quality of CdCl2 treatment and the thickness of the CdTe layer. For the case of magnetron sputtered cells, nonuniformities have a relatively weak dependence on CdS layer thickness. We find also that some nonuniformities arise from postdeposition sample treatment and handling.
Keywords
Astronomy; Fabrication; Glass; Heterojunctions; Loss measurement; Photovoltaic cells; Physics; Testing; Thickness measurement; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location
San Diego, CA, USA
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2008.4922541
Filename
4922541
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