• DocumentCode
    3377801
  • Title

    Dependence CdS/CdTe solar cells efficiency and nonuniformity on CdS layer thickness

  • Author

    Plotnikov, V.V. ; Davies, A.R. ; Sites, J.R. ; Compaan, A.D.

  • Author_Institution
    Department of Physics and Astronomy, University of Toledo, OH 43606 USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We have prepared cell with a variable thickness of CdS layer to get an understanding of the optimum thickness as well as it lowest limits for practical purposes. We used quantum efficiency current-voltage and light beam induce current testing to investigate cell performance as well as nonuniformity. The best results are achieved with 0.1 micron CdS layer. This number does depend slightly on the quality of CdCl2 treatment and the thickness of the CdTe layer. For the case of magnetron sputtered cells, nonuniformities have a relatively weak dependence on CdS layer thickness. We find also that some nonuniformities arise from postdeposition sample treatment and handling.
  • Keywords
    Astronomy; Fabrication; Glass; Heterojunctions; Loss measurement; Photovoltaic cells; Physics; Testing; Thickness measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922541
  • Filename
    4922541