Title :
Dependence CdS/CdTe solar cells efficiency and nonuniformity on CdS layer thickness
Author :
Plotnikov, V.V. ; Davies, A.R. ; Sites, J.R. ; Compaan, A.D.
Author_Institution :
Department of Physics and Astronomy, University of Toledo, OH 43606 USA
Abstract :
We have prepared cell with a variable thickness of CdS layer to get an understanding of the optimum thickness as well as it lowest limits for practical purposes. We used quantum efficiency current-voltage and light beam induce current testing to investigate cell performance as well as nonuniformity. The best results are achieved with 0.1 micron CdS layer. This number does depend slightly on the quality of CdCl2 treatment and the thickness of the CdTe layer. For the case of magnetron sputtered cells, nonuniformities have a relatively weak dependence on CdS layer thickness. We find also that some nonuniformities arise from postdeposition sample treatment and handling.
Keywords :
Astronomy; Fabrication; Glass; Heterojunctions; Loss measurement; Photovoltaic cells; Physics; Testing; Thickness measurement; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2008.4922541