On the application of fault detection observers to analog circuit testing

The purpose of this paper is to show the applicability of fault detection observers to analog circuit testing. A fault detection observer is regarded as a special case in the state estimation approach for detecting faults in analog circuits for testing purposes. It is shown that the structure of fault detection observers used in fault diagnosis of dynamic systems can be applied successfully to testing (dynamic) analog circuits. Fault detection observers are easily derivable from the conventional test technique based on simple data comparison. The use of fault detection observers leads directly to a go/no-go decision. The fault sensitivity can be controlled in a simple way