• DocumentCode
    3378118
  • Title

    Testability and test protocol expansion in hierarchical macro testing

  • Author

    Marinissen, Erik Jan ; Kuiper, Krijn ; Wouters, Clemens

  • Author_Institution
    Philips Res. Labs., Eindhoven, Netherlands
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    28
  • Lastpage
    36
  • Abstract
    Test protocols play an important role within the macro tests strategy. They describe, independently of the actual test pattern values and in detail how, at which terminals, and at which moments tests stimuli should be applied and responses should be observed. Initially, test protocols are described at the terminals of the macro they test. Final execution should take place at the chip pins. Transforming a test protocol defined at the (local) macro terminals into a test protocol defined at the (global) chip pins is called test protocol expansion. Failing test protocol expansion indicates testability problems of the circuit under consideration
  • Keywords
    automatic testing; design for testability; fault location; integrated circuit testing; ASIC; TDA1307; Video Datapath Chip; chip pins; hierarchical macro testing; macro terminals; test protocol expansion; testability; Access protocols; Circuit testing; Electronic equipment testing; Electronic mail; Hardware; Integrated circuit testing; Laboratories; Lakes; Pins; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1993. Proceedings of ETC 93., Third
  • Conference_Location
    Rotterdam
  • Print_ISBN
    0-8186-3360-3
  • Type

    conf

  • DOI
    10.1109/ETC.1993.246536
  • Filename
    246536