Title :
Redundant states in test control block design
Author :
Thijssen, Loek ; Bouwman, Frank ; Vink, Hans
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
The number of states in sequential circuit designs does not usually equal to 2n This results in a number of redundant state codes. It has been accepted that redundant state codes are used as don´t cares in the next-state equations. The target is a reduction of the hardware costs. In doing so the behaviour of the circuit in redundant states has not been specified in advance. Error handling and testability may be a serious problem. This paper shows there is an alternative. Redundant states can be fully specified in a simple and meaningful way, often with even better hardware efficiency than a state assignment with don´t cares. Some additional results in encoding test control blocks are also given
Keywords :
logic testing; minimisation; redundancy; sequential circuits; costs; equivalent states; hardware efficiency; logic minimisation; optimisation; redundant state codes; sequential circuit; test control block; Circuit testing; Clocks; Costs; Digital circuits; Equations; Hardware; History; Logic testing; Sequential circuits; Shift registers;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246554