Title :
Temperature dependence of elastic, piezoelectric and dielectric properties of La3Ga5SiO14 and La3Ga5.5Ta0.5O14: An application of resonant ultrasound spectroscopy
Author :
Schreurer, R. ; Rupp, J. ; Thybaut, C.
Author_Institution :
Lab. of Crystallogr., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
The electromechanical properties of langasite, La3Ga5SiO14, and langatate, La3Ga5.5Ta0.5O14, have been studied at elevated temperatures using resonant ultrasound spectroscopy (RUS). Furthermore, the coefficients of thermal expansion, the dielectric constants and their temperature derivatives, and the temperature evolution of the specific conductivity were investigated employing standard methods. At temperatures above about 550 K both compounds show strong ultrasonic at tenuation phenomena at frequencies below 1 MHz which are correlated with a rising electric conductivity.
Keywords :
elastic constants; electrical conductivity; electromechanical effects; gallium compounds; lanthanum compounds; permittivity; piezoelectric materials; ultrasonic absorption; 1 MHz; 550 K; La3Ga5.5Ta0.5O14; La3Ga5SiO14; dielectric constants; dielectric properties; elastic properties; electromechanical properties; langasite; langatate; piezoelectric properties; resonant ultrasound spectroscopy; rising electric conductivity; specific conductivity; strong ultrasonic attenuation phenomena; temperature dependence; thermal expansion; Chromium; Crystallization; Crystallography; Dielectric constant; Electrochemical impedance spectroscopy; Resonance; Temperature dependence; Thermal conductivity; Thermal expansion; Ultrasonic imaging;
Conference_Titel :
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
Print_ISBN :
0-7803-7582-3
DOI :
10.1109/ULTSYM.2002.1193423