DocumentCode :
3378329
Title :
Temperature dependence of elastic, piezoelectric and dielectric properties of La3Ga5SiO14 and La3Ga5.5Ta0.5O14: An application of resonant ultrasound spectroscopy
Author :
Schreurer, R. ; Rupp, J. ; Thybaut, C.
Author_Institution :
Lab. of Crystallogr., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Volume :
1
fYear :
2002
fDate :
8-11 Oct. 2002
Firstpage :
373
Abstract :
The electromechanical properties of langasite, La3Ga5SiO14, and langatate, La3Ga5.5Ta0.5O14, have been studied at elevated temperatures using resonant ultrasound spectroscopy (RUS). Furthermore, the coefficients of thermal expansion, the dielectric constants and their temperature derivatives, and the temperature evolution of the specific conductivity were investigated employing standard methods. At temperatures above about 550 K both compounds show strong ultrasonic at tenuation phenomena at frequencies below 1 MHz which are correlated with a rising electric conductivity.
Keywords :
elastic constants; electrical conductivity; electromechanical effects; gallium compounds; lanthanum compounds; permittivity; piezoelectric materials; ultrasonic absorption; 1 MHz; 550 K; La3Ga5.5Ta0.5O14; La3Ga5SiO14; dielectric constants; dielectric properties; elastic properties; electromechanical properties; langasite; langatate; piezoelectric properties; resonant ultrasound spectroscopy; rising electric conductivity; specific conductivity; strong ultrasonic attenuation phenomena; temperature dependence; thermal expansion; Chromium; Crystallization; Crystallography; Dielectric constant; Electrochemical impedance spectroscopy; Resonance; Temperature dependence; Thermal conductivity; Thermal expansion; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN :
1051-0117
Print_ISBN :
0-7803-7582-3
Type :
conf
DOI :
10.1109/ULTSYM.2002.1193423
Filename :
1193423
Link To Document :
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