DocumentCode
3378395
Title
Phase coherent, event synchronized test system architecture
Author
Dinteman, Bryan J.
fYear
1993
fDate
19-22 Apr 1993
Firstpage
312
Lastpage
319
Abstract
It is increasingly difficult to provide test conditions utilising ATE equipment which correlate with applications conditions in which devices are designed to operate. This paper suggests functional parameters and an architecture conductive to successful and economical ATE testing of time differentiated functionality
Keywords
Frequency conversion; Frequency synchronization; Hardware; Instruments; Qualifications; Resumes; Sampling methods; Signal generators; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246569
Filename
246569
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