Title :
Fast Poisson solvers for thermal analysis
Author :
Qian, Haifeng ; Sapatnekar, Sachin S.
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Accurate and efficient thermal analysis for a VLSI chip is crucial, both for sign-off reliability verification and for design-time circuit optimization. To determine an accurate temperature profile, it is important to simulate a die together with its thermal mounts: this requires solving Poisson´s equation on a non-rectangular 3D domain. This paper presents a class of eigendecomposition-based fast Poisson solvers (FPS) for chiplevel thermal analysis. We start with a solver that solves a rectangular 3D domain with mixed boundary conditions in O(NlogN) time, where N is the dimension of the finite-difference matrix. Then we reveal, for the first time in the literature, a strong relation between fast Poisson solvers and Green-function-based methods. Finally, we propose an FPS method that leverages the preconditioned conjugate gradient method to solve non-rectangular 3D domains efficiently. We demonstrate that this approach solves a system of dimension 5.33e6 in only 11 Conjugate Gradient iterations, with a runtime of 171 seconds, a 6X speedup over the popular ICCG solver.
Keywords :
Poisson equation; VLSI; finite difference methods; integrated circuit design; integrated circuit reliability; thermal management (packaging); Green-function-based methods; Poisson´s equation; VLSI chip; chiplevel thermal analysis; design-time circuit optimization; eigendecomposition-based fast Poisson solvers; finite-difference matrix; mixed boundary conditions; nonrectangular 3D domain; sign-off reliability verification; temperature profile; Approximation methods; Computational modeling; Equations; Integrated circuit modeling; Mathematical model; Thermal analysis; Three dimensional displays; Green function; fast Poisson solver; thermal analysis;
Conference_Titel :
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-8193-4
DOI :
10.1109/ICCAD.2010.5654249