Sweep time, spectral mismatch and light soaking in thin film module measurement

The effect of sweep time, spectrum and light soaking on thin film measurements with a flash simulator are reviewed. Module performance was measured with varying sweep times from less than 1ms to 30ms and a comparison between module performance indoors and outdoors was made. Sweep times longer than 1 ms did not affect the measured performance of CdTe and CIGS modules. A 2% increase in power was observed for a-Si modules. Device performance indoors and outdoors was compared. Very accurate correspondence was observed for CIGS modules as well as double junction a-Si. CdTe modules showed a reasonably good match in terms of maximum power.