• DocumentCode
    3378574
  • Title

    Improving cluster tools performance using Colored Petri Nets in semiconductor manifacturing

  • Author

    Dongjin Kim ; Cimren, Emrah ; Havey, Robert ; Zaidi, A.K.

  • Author_Institution
    Micron Technol. Inc., Manassas, VA, USA
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Semiconductor manufacturing is a capital-extensive industry. How to utilize billions of dollars of equipment as efficiently as possible is a critical factor for a semiconductor manufacturer to succeed in stiff competition. Improving performance of manufacturing process increases overall tool throughput, reduces operating costs, and saves companies millions of dollars. In this study, we develop a methodology to analyze and improve a cluster tool´s performance. A Colored Petri Net model is developed to determine internal bottleneck resource of the tool. Results conclude that the methodology improves tool efficiency and provides significant cost savings.
  • Keywords
    Petri nets; semiconductor industry; cluster tools; colored Petri nets; cost savings; semiconductor manufacturing; tool efficiency; Analytical models; Atmosphere; Job shop scheduling; Load modeling; Mathematical model; Robots; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2012 Winter
  • Conference_Location
    Berlin
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4673-4779-2
  • Electronic_ISBN
    0891-7736
  • Type

    conf

  • DOI
    10.1109/WSC.2012.6465316
  • Filename
    6465316