DocumentCode
3378574
Title
Improving cluster tools performance using Colored Petri Nets in semiconductor manifacturing
Author
Dongjin Kim ; Cimren, Emrah ; Havey, Robert ; Zaidi, A.K.
Author_Institution
Micron Technol. Inc., Manassas, VA, USA
fYear
2012
fDate
9-12 Dec. 2012
Firstpage
1
Lastpage
12
Abstract
Semiconductor manufacturing is a capital-extensive industry. How to utilize billions of dollars of equipment as efficiently as possible is a critical factor for a semiconductor manufacturer to succeed in stiff competition. Improving performance of manufacturing process increases overall tool throughput, reduces operating costs, and saves companies millions of dollars. In this study, we develop a methodology to analyze and improve a cluster tool´s performance. A Colored Petri Net model is developed to determine internal bottleneck resource of the tool. Results conclude that the methodology improves tool efficiency and provides significant cost savings.
Keywords
Petri nets; semiconductor industry; cluster tools; colored Petri nets; cost savings; semiconductor manufacturing; tool efficiency; Analytical models; Atmosphere; Job shop scheduling; Load modeling; Mathematical model; Robots; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location
Berlin
ISSN
0891-7736
Print_ISBN
978-1-4673-4779-2
Electronic_ISBN
0891-7736
Type
conf
DOI
10.1109/WSC.2012.6465316
Filename
6465316
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