DocumentCode :
3378574
Title :
Improving cluster tools performance using Colored Petri Nets in semiconductor manifacturing
Author :
Dongjin Kim ; Cimren, Emrah ; Havey, Robert ; Zaidi, A.K.
Author_Institution :
Micron Technol. Inc., Manassas, VA, USA
fYear :
2012
fDate :
9-12 Dec. 2012
Firstpage :
1
Lastpage :
12
Abstract :
Semiconductor manufacturing is a capital-extensive industry. How to utilize billions of dollars of equipment as efficiently as possible is a critical factor for a semiconductor manufacturer to succeed in stiff competition. Improving performance of manufacturing process increases overall tool throughput, reduces operating costs, and saves companies millions of dollars. In this study, we develop a methodology to analyze and improve a cluster tool´s performance. A Colored Petri Net model is developed to determine internal bottleneck resource of the tool. Results conclude that the methodology improves tool efficiency and provides significant cost savings.
Keywords :
Petri nets; semiconductor industry; cluster tools; colored Petri nets; cost savings; semiconductor manufacturing; tool efficiency; Analytical models; Atmosphere; Job shop scheduling; Load modeling; Mathematical model; Robots; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location :
Berlin
ISSN :
0891-7736
Print_ISBN :
978-1-4673-4779-2
Electronic_ISBN :
0891-7736
Type :
conf
DOI :
10.1109/WSC.2012.6465316
Filename :
6465316
Link To Document :
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