Title :
Origin of 1/f noise in InAlAs/InGaAs HEMTs
Author :
Mihaila, M. ; Heedt, C. ; Scheffer, F. ; Tegude, F.J.
Author_Institution :
ICCE, Bucharest, Romania
Abstract :
For some applications (e.g.: mixers, oscillators), the 1/f noise upconversion limits the microwave performances of all kinds of HEMTs. That is why the origin of 1/f noise in HEMTs is highly needed. Previously it has been suggested that the channel is the main 1/f noise source at low drain bias. Recent experiments performed on different HEMT´s structures indicated the InAlAs spacer and buffer as sources of 1/f noise. Some of these experiments also pointed to heterointerfaces as sources of 1/f noise. All these experiments quite clearly established the topology of the 1/f noise sources. A step further would be to answer which microscopic mechanism is responsible for the 1/f noise generation in a two-dimensional electron gas (2DEG). The purpose of this work is to identify lattice scattering as the microscopic source of 1/f noise in InAlAs/InGaAs HEMTs
Keywords :
1/f noise; III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; interface phonons; microwave field effect transistors; semiconductor device noise; two-dimensional electron gas; 1/f noise generation; 1/f noise sources; 2DEG; HEMTs; InAlAs-InGaAs; lattice scattering; microscopic mechanism; microwave performance limitation; two-dimensional electron gas; Electron microscopy; HEMTs; Indium compounds; Indium gallium arsenide; Lattices; MODFETs; Microwave oscillators; Noise generators; Scattering; Topology;
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
DOI :
10.1109/ICIPRM.1996.492259