Title :
Research on nano-ampere current-measuring meter system
Author :
Lin Wei ; Deng Shao-ai
Author_Institution :
Sch. of Autom., Wuhan Univ. of Technol., Wuhan, China
Abstract :
Nano-level current-measuring device is important for the scanning tunneling microscope. The nano-ampere current measuring meter system based on high-precision amplifiers is mainly designed as two-stage amplifiers structure. Some removing interference ways of hardware are introduced in the design and fracture of the PCB. In the current-measuring meter system, wavelet transform is adopted to decrease noise. The experiments show that, the measurement results of this device can be obtained to an accuracy of 1 nA, and the device can reduce some noise interference.
Keywords :
amplifiers; electric current measurement; printed circuits; wavelet transforms; PCB; current-measuring meter system; high-precision amplifiers; nano-ampere; noise interference; scanning tunneling microscope; wavelet transform; Biomedical measurements; Capacitance; Circuit noise; Current measurement; Radiofrequency amplifiers; Signal denoising; Thermal resistance; Tunneling; Voltage; Wavelet transforms; Nano-ampere current-measuring; signal denoising with wavelet transform; two-stage amplifier;
Conference_Titel :
BioMedical Information Engineering, 2009. FBIE 2009. International Conference on Future
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-4690-2
Electronic_ISBN :
978-1-4244-4692-6
DOI :
10.1109/FBIE.2009.5405833
