• DocumentCode
    3378699
  • Title

    Towards integrating level-3 Features with perspiration pattern for robust fingerprint recognition

  • Author

    Abhyankar, Aditya ; Schuckers, Stephine

  • Author_Institution
    Electr. & Comput. Eng Dept., Clarkson Univ., Potsdam, NY, USA
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    3085
  • Lastpage
    3088
  • Abstract
    Level-3 fingerprint features from fingerprint images like pores are difficult to capture detect, and involve high resolution scanners with higher ppi count. However, these features provide finer information about a fingerprint characteristics. Furthermore, fingerprint pores may be useful in determining liveness of fingerprint in order to prevent spoofing of fingerprint devices. In this study fingerprint pores along the ridges are used for fingerprint matching. Wavelet based fingerprint enhancement techniques are implemented to ease detection of the level-3 features. Delaunay triangulation based alignment and matching of the fingerprints is performed. The pores are checked for the liveness by perspiration activity in the time series captures. The developed matching scheme is tested for the high resolution data (686 ppi) for 114 live and spoof fingerprint classes. ROC is plotted and EER of 2.97% is obtained.
  • Keywords
    fingerprint identification; image enhancement; image matching; wavelet transforms; Delaunay triangulation based alignment; Delaunay triangulation based matching; fingerprint images; fingerprint matching; high resolution scanners; level-3 features detection; perspiration pattern; ppi count; robust fingerprint recognition; wavelet based fingerprint enhancement techniques; Feature extraction; Fingerprint recognition; Image edge detection; Image resolution; Wavelet analysis; Wavelet domain; Wavelet transforms; fingerprints; level-3 features; liveness; perspiration pattern; pores; wavelets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5654261
  • Filename
    5654261