Title :
An integrated patch-clamp system with dual Input
Author :
Weerakoon, Pujitha ; Sigworth, Fred ; Kindlmann, Peter ; Santos-Sacchi, Joseph ; Yang, Youshan ; Culurciello, Eugenio
Author_Institution :
Yale Univ., New Haven, CT, USA
fDate :
May 30 2010-June 2 2010
Abstract :
We present the first, fully integrated, multi-channel implementation of a patch-clamp measurement system. The system was implemented in a 0.5 μm silicon-on-sapphire process. The system can record two simultaneous cell membrane currents up to ±20 μA with a rms noise of 8 pA in a 10 kHz bandwidth. The system can compensate for the capacitance and resistance of the pipette electrode, up to 10 pF and 100 MΩ respectively. The system die size is 3 × 3 mm and the power consumption is 5 mW per channel at 3.3 V.
Keywords :
electrodes; operational amplifiers; sapphire; silicon-on-insulator; RMS noise; Si-Al2O3; bandwidth 10 kHz; capacitance compensation; current 8 pA; integrated patch-clamp system; operational amplifier design; patch-clamp measurement system; pipette electrode; power 5 mW; power consumption; resistance compensation; silicon-on-sapphire process; simultaneous cell membrane currents; size 0.5 mum; voltage 3.3 V; Biomembranes; Cells (biology); Circuits; Clamps; Current measurement; Electrical resistance measurement; Electrodes; Parasitic capacitance; Radiofrequency amplifiers; Voltage;
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
DOI :
10.1109/ISCAS.2010.5537382
