DocumentCode
3378738
Title
Testing interconnects: a pin adjacency approach
Author
McBean, D. ; Moore, W.R.
Author_Institution
Dept. of Eng. Sci., Oxford Univ., UK
fYear
1993
fDate
19-22 Apr 1993
Firstpage
484
Lastpage
490
Abstract
This paper looks at a new fault model used for shorts between nets on a PCB, the pin-adjacency fault model, and the implementation of two algorithms. The pin-adjacency detection and diagnosis algorithms for detecting and diagnosing these bridging faults. The authors represent the nets and their likelihood to short as a graph, and in conjunction with the new algorithms are able to generate reduced test sets. This represents a huge saving over existing algorithms which assume that any two nets are likely to short, as opposed to the new more realistic pin-adjacency fault model
Keywords
boundary scan testing; fault location; logic testing; printed circuit testing; boundary scan testing; fault model; interconnects testing; pin adjacency; shorts; Bridges; Copper; Fault detection; Fault diagnosis; Lead; Logic testing; Pins; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246596
Filename
246596
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