• DocumentCode
    3378738
  • Title

    Testing interconnects: a pin adjacency approach

  • Author

    McBean, D. ; Moore, W.R.

  • Author_Institution
    Dept. of Eng. Sci., Oxford Univ., UK
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    484
  • Lastpage
    490
  • Abstract
    This paper looks at a new fault model used for shorts between nets on a PCB, the pin-adjacency fault model, and the implementation of two algorithms. The pin-adjacency detection and diagnosis algorithms for detecting and diagnosing these bridging faults. The authors represent the nets and their likelihood to short as a graph, and in conjunction with the new algorithms are able to generate reduced test sets. This represents a huge saving over existing algorithms which assume that any two nets are likely to short, as opposed to the new more realistic pin-adjacency fault model
  • Keywords
    boundary scan testing; fault location; logic testing; printed circuit testing; boundary scan testing; fault model; interconnects testing; pin adjacency; shorts; Bridges; Copper; Fault detection; Fault diagnosis; Lead; Logic testing; Pins; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1993. Proceedings of ETC 93., Third
  • Conference_Location
    Rotterdam
  • Print_ISBN
    0-8186-3360-3
  • Type

    conf

  • DOI
    10.1109/ETC.1993.246596
  • Filename
    246596