• DocumentCode
    3378782
  • Title

    Best Paper Award: The effect of a threshold failure time and bimodal behavior on the electromigration lifetime of copper interconnects

  • Author

    Filippi, R.G. ; Wang, Pi-Chung ; Brendler, A. ; McLaughlin, P.S. ; Poulin, J. ; Redder, B. ; Lloyd, J.R. ; Demarest, J.J.

  • Author_Institution
    IBM Systems and Technology Group, Hopewell Junction, NY, USA
  • fYear
    2011
  • fDate
    10-14 April 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The award winners and the titles of their award winning papers are listed.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2011 IEEE International
  • Conference_Location
    Monterey, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-9113-1
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2011.5784438
  • Filename
    5784438
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3378782